부산대학교 도서관

Phase stability diagram and boundary of a- and c-axis orientation of SmBa2Cu3O7-y (SmBCO) thin films grown by pulsed laser deposition (PLD) were reported with studies based on x-ray diffraction [1]. Four different samples are systematically analyzed: normal c-axis oriented orthorhombic SmBa2Cu3O7-y, a-axis oriented SmBa2Cu3O7-y, c-axis oriented orthorhombic SmBa2Cu3O7-y with Sm2BaCuO5 phase, and a mixture with c-axis oriented orthorhombic SmBa2Cu3O7-y and anomalously long-c tetragonal SmBa2Cu3Ox. Raman scattering spectroscopy equipped with polarization analysis elucidates the crystal orientation and the origin of the growth of the materials. It indicates that the technique can be used for quality control of conductor manufacturing processes as well as for enhancement of the materials properties.