학술논문
A sampling method of oriented small sample from fault cores for SEM observation / 走査型電子顕微鏡（SEM）用の断層中軸部小型定方位試料の作製法
Document Type
Journal Article
Author
Source
地質学雑誌 / The Journal of the Geological Society of Japan. 2013, 119(11):727
Subject
Language
Japanese
ISSN
0016-7630
1349-9963
1349-9963
Abstract
Staples for a stapler can be used as frames for collecting small oriented samples from fragile and rare areas of fault gouge. Slots are produced on the surface of the fault gouge in order to insert staples; these staples are used in groups of 10 or less and comprise three small surfaces at right angles to each other. Pre-oriented staples within the slot are then removed before preparation for Scanning Electron Microscope (SEM) observation and analysis. This approach requires staples, a knife and other simple equipment for use in both the field and laboratory.