학술논문

Fabrication and Characterization of High-k Gate Insulating Films by RF-Sputtering Method / RFスパッタ法を用いたHigh-k ゲート絶縁膜の作製と評価
Document Type
Journal Article
Source
JSAP Annual Meetings Extended Abstracts. 2020, :1214
Subject
13a-PA2-2
dielectric thin films
ferroelectric
thin films
強誘電体
強誘電体・高誘電率薄膜
強誘電体薄膜
薄膜
薄膜・表面
高誘電率薄膜
Language
Japanese
ISSN
2436-7613