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학술논문

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F-3 Quantitative measurement of linear and nonlinear dielectric characteristics using scanning nonlinear dielectric microscopy / F-3 走査型非線形誘電率顕微鏡を用いた定量計測

Document Type

Journal Article

Author

H. Odagawa; K. Oohara; S. Kazuta; Y. Cho; 大原鉱也; 小田川裕之; 数田聡; 長康雄

Source

Proceedings of Symposium on Ultrasonic Electronics. 1999, :303

Subject

Language

Japanese

ISSN

2433-1414

Online Access

Open Access (JSTAGE) Find it@PNU

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