학술논문

Evaluation of crystal structures and piezoelectric properties of epitaxial Pb(Zr,Ti)O3 thin films grown on Si substrates / Si基板上エピタキシャルPb(Zr,Ti)O3薄膜の結晶構造と圧電特性の評価
Document Type
Journal Article
Source
JSAP Annual Meetings Extended Abstracts. 2020, :1245
Subject
15a-D419-4
XRDその場観察
epitaxial piezoelectric thin film
evaluation of piezoelectric properties
in situ XRD observation
エピタキシャル圧電薄膜
圧電評価
強誘電・圧電デバイス
強誘電体薄膜
薄膜・表面
Language
Japanese
ISSN
2436-7613