학술논문
Characterization of polycrystalline YIG thin films on Si Substrates by RF Magnetron Sputtering and Annealing / RFマグネトロンスパッタリング法と熱処理によって製膜したSi基板上多結晶YIG薄膜の評価
Document Type
Journal Article
Author
Source
JSAP Annual Meetings Extended Abstracts. 2019, :1221
Subject
Language
Japanese
ISSN
2436-7613