학술논문

Sub-2-ps, static phase error calibration technique incorporating measurement uncertainty cancellation for multi-gigahertz time-interleaved T/H circuits
Document Type
Technical report
Source
IEEE Transactions on Circuits and Systems-I-Regular Papers. Feb 2012, Vol. 59 Issue 2, p276, 8 p.
Subject
Standard IC
Analog to digital converters -- Usage
Integrated circuits -- Innovations
Semiconductor chips -- Innovations
Complementary metal oxide semiconductors -- Usage
Simulation methods -- Usage
Voltage -- Measurement
Language
English
ISSN
1549-8328