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The effect of self-heating in LDMOSFET expansion regime
Document Type
Technical report
Author
Hsueh-Liang Chou; Ng, J.C.W.; Ruey-Hsin Liou; Yu-Chang Jong; Hsiao-Chin Tuan; Chih-Fang Huang; Jeng Gong
Source
IEEE Transactions on Electron Devices. Nov 2012, Vol. 59 Issue 11, p3042, 6 p.
Subject
Metal oxide semiconductor field effect transistors -- Innovations
Numerical analysis -- Usage
Simulation methods -- Usage
Voltage -- Measurement
Ionization -- Analysis
Electric fields -- Usage
Language
English
ISSN
0018-9383

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