학술논문

An original approach asked on data exchange between car manufacturers and suppliers to estimate susceptibility threshold by numerical simulation at early design stage
Document Type
Technical report
Source
IEEE Transactions on Electromagnetic Compatibility. April 2013, Vol. 55 Issue 2, p342, 11 p.
Subject
Standard IC
Electromagnetic compatibility -- Analysis
Integrated circuits -- Usage
Semiconductor chips -- Usage
Numerical analysis -- Usage
Stochastic analysis -- Usage
Language
English
ISSN
0018-9375