학술논문
Model-based frequency response characterization of a digital-image analysis system for epifluorescence microscopy
Document Type
Academic Journal
Author
Source
Applied Optics. March 10, 1992, Vol. 31 Issue 8, p1083, 10 p.
Subject
Language
ISSN
1559-128X
Abstract
We describe a model-based method for estimating the spatial frequency response of a digital-imaging system (e.g., a CCD camera) that is modeled as a linear, shift-invariant image acquisition subsystem that is cascaded with a linear, shift-variant sampling subsystem. The method characterizes the two-dimensional frequency response of the image acquisition subsystem to beyond the Nyquist frequency by accounting explicitly for insufficient sampling and the sample - scene phase. Results for simulated systems and a real CCD-based epifluorescence microscopy system are presented to demonstrate the accuracy of the method.
A proposed method for estimating the spatial frequency response of a digital-imaging system such as a charge-coupled device camera is designed as a linear, shift-invariant image acquisition subsystem cascaded with a sampling subsystem with the same features. The method is two-dimensional and estimates the image acquisition subsystem's response beyond the Nyquist frequency by recording multiple images of the object. Simulations show that the method can produce accurate descriptions of frequency characteristics of high-performance epifluorescence microscopy imaging systems.
A proposed method for estimating the spatial frequency response of a digital-imaging system such as a charge-coupled device camera is designed as a linear, shift-invariant image acquisition subsystem cascaded with a sampling subsystem with the same features. The method is two-dimensional and estimates the image acquisition subsystem's response beyond the Nyquist frequency by recording multiple images of the object. Simulations show that the method can produce accurate descriptions of frequency characteristics of high-performance epifluorescence microscopy imaging systems.