부산대학교 도서관

To link to full-text access for this article, visit this link: http://dx.doi.org/10.1016/j.tsf.2005.08.264 Byline: Y.K. An (a), B. Dai (a), Z.H. Mai (a), J.W. Cai (a), Z.H. Wu (b) Keywords: CoFe/Cu multilayers; Structural analysis; X-ray scattering; Sputtering Abstract: The structures of Co.sub.90Fe.sub.10/Cu multilayers were investigated by X-ray anomalous scattering techniques. It is found that the Cu/Co.sub.90Fe.sub.10 and Co.sub.90Fe.sub.10/Cu interfaces have different thermal behavior upon annealing. For the as-deposited sample, a Cu.sub.2Co intermixing region exists at the Cu/Co.sub.90Fe.sub.10 interface, while the Co.sub.90Fe.sub.10/Cu interface is sharp. There exists only a Co.sub.70Fe.sub.30 sublayer close to the interface in the Co.sub.90Fe.sub.10 layer. After annealing at 285 [degrees]C for 2 h, more Cu react with Co to create a Cu.sub.3Co intermixing region at the Cu/Co.sub.90Fe.sub.10 interface, while no obvious change is observed at the Co.sub.90Fe.sub.10/Cu interface. The X-ray diffuse scattering measurements performed with the incident X-ray energy close to Fe, Co and Cu K edges, respectively, revealed an island growth mechanism of the multilayers. Author Affiliation: (a) Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China (b) Beijing Synchrotron Radiation Facility (BSRF), Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100039, China Article History: Received 1 November 2004; Revised 5 July 2005; Accepted 15 August 2005