학술논문
Olympus documents manufacturing cleanliness with automated filter and particle analysis system
Document Type
Periodical
Author
Source
Electronic Device Failure Analysis. February 1, 2010, Vol. 12 Issue 1, p42, 2 p.
Subject
Language
English
ISSN
1537-0755
Abstract
In fields as diverse as aerospace, pharmaceuticals, heavy machinery, and medical devices, inspecting and analyzing residue on filters is key for documenting the purity and cleanliness of the manufacturing process [...]