학술논문
Electrical characterization and modeling of alternating-current thin-film electroluminescent devices
Document Type
Academic Journal
Author
Source
IEEE Transactions on Electron Devices. May 1992, Vol. 39 Issue 5, p1122, 7 p. chart
Subject
Language
ISSN
0018-9383
Abstract
The capacitance-voltage (C-V) characteristic curve method, together with a device simulation software, is employed in describing the electrical properties of alternating current thinfilm electroluminescent devices. It calculated various circuit parameters such as threshold potential, insulator capacitance and interface trap density for comparison of computer simulated and measured C-V data.