학술논문

How to beat the Rayleigh resolution limit: a lecture demonstration
Document Type
Abstract
Source
American Journal of Physics. June, 2002, Vol. 70 Issue 6, p587, 8 p.
Subject
Physical measurements -- Evaluation
Diffraction patterns -- Analysis
Rayleigh scattering -- Measurement
Physics
Language
ISSN
0002-9505
Abstract
An experiment is described in which the effect of instrument aperture size on resolution is easily demonstrated. Using diffraction as a tool rather than a limit to resolution, one can further demonstrate the possibility of detecting the presence of more than one object, even when the instrument cannot resolve the objects. [DOI: 10.1119/1.1463736]