학술논문
Ambient induced degradation and chemically activated recovery in copper phthalocyanine thin film transistors
Document Type
Technical report
Author
Source
Journal of Applied Physics. August 1, 2009, Vol. 106 Issue 3, 034505-1-034505-8
Subject
Language
English
ISSN
0021-8979
Abstract
The article studies the electrical degradation of copper phthalocyanine (CuPc) organic thin film transistors (OTFTs) using thick and ultrathin channel thicknesses. Results conclude that data are consistent with aging resulting primarily from adsorption of strong oxidants from ambient air within the grain boundaries of the CuPc films.