학술논문

Advances in long-wavelength native phasing at X-ray free-electron lasers
Document Type
Report
Source
International Union of Crystallography Journal. November, 2020, Vol. 7 Issue 6, p965, 11 p.
Subject
White, T.H. (British writer)
Language
English
ISSN
2052-2525
Abstract
Keywords: serial femtosecond crystallography; X-ray free-electron lasers; single-wavelength anomalous diffraction; de novo protein structure determination; anomalous data-quality indicators. PDB references: [A.sub.2A], 4.57 keV, all diffraction images, 6s0l; [A.sub.2A], 4.57 keV, 50 000 diffraction images, 6s0q; thaumatin, 4.57 keV, all diffraction images, 6s19; thaumatin, 4.57 keV, 20 000 diffraction images, 6s1d; thaumatin, 6.06 keV, all diffraction images, 6s1e; thaumatin, 6.06 keV, 50 000 diffraction images, 6s1g Supporting information: this article has supporting information at www.iucrj.org
Long-wavelength pulses from the Swiss X-ray free-electron laser (XFEL) have been used for de novo protein structure determination by native single-wavelength anomalous diffraction (native-SAD) phasing of serial femtosecond crystallography (SFX) [...]