학술논문

Two-beam-current method for e-beam writing gray-scale masks and its application to high-resolution microstructures
Document Type
Author abstract
Report
Source
Applied Optics. June 10, 2008, Vol. 47 Issue 17, p3177, 8 p.
Subject
United States
Language
English
ISSN
1559-128X
Abstract
A two-beam-current method is introduced for e-beam writing in the fabrication of gray-scale masks. Compared with the simpler single-current method, the two-beam-current method offers two important advantages: (a) it can achieve a much larger dynamic range for e-beam exposure; (b) the writing time for a gray-scale mask can be reduced when a large pattern is to be written. Here, the new method is first described in detail and its application to the fabrication of our new gray-scale mask is demonstrated. Then, the improved gray-scale masks were employed to fabricate large dynamic range, high-resolution micro-optical elements of less than a couple of micrometers depth, using deep ultraviolet lithography at 248 nm wavelength and an inductively coupled plasma reactive ion etching system. OCIS codes: 220.2740, 350.4600, 220.4000, 350.3950.