학술논문

A self-reconfigurable platform for built-in self-test applications
Document Type
Academic Journal
Source
IEEE Transactions on Instrumentation & Measurement. August, 2007, Vol. 56 Issue 4, p1307, 9 p.
Subject
Circuit designer
Integrated circuit design
Fault tolerance
Parallel processing
Circuit design -- Analysis
Fault tolerance (Computers) -- Design and construction
Parallel processing -- Methods
Language
English
ISSN
0018-9456