학술논문

A new methodology for the on-wafer characterization of RF integrated transformers
Document Type
Author abstract
Source
IEEE Transactions on Microwave Theory and Techniques. May, 2007, Vol. 55 Issue 5, p1046, 8 p.
Subject
Electric transformers -- Research
Electric transformers -- Electric properties
Business
Computers
Electronics
Electronics and electrical industries
Language
English
ISSN
0018-9480
Abstract
This paper presents a new methodology for measuring integrated transformers. It gives a description of the transformer and its specifications and develops a measurement system. It also presents different transformer geometries and transformer terminal combinations. After the theoretical exposition of the measurement system, a differential-differential integrated transformer and a single-single integrated transformer are measured using this system in order to validate the methodology proposed. In the state-of-the-art, there is no fixed methodology for measuring the coupling factor k of a transformer. This paper presents a new methodology for obtaining this figure-of-merit systematically. As a result of this measurement, this paper presents the values obtained and corroborates the measurement system. Thus, this paper presents and explains a new systematic method for measuring transformers. Index Terms--Coupling factor, integrated transformer, measurement system, methodology.