학술논문
Tiefenprofiluntersuchungen an ionenleitenden Gläsern mittels Flugzeit-Sekundärionen-Massenspektrometrie (ToF-SIMS)
Depth profile investigations on ion-conducting glasses using flight time secondary mass spectrometry (ToF-SIMS)
Depth profile investigations on ion-conducting glasses using flight time secondary mass spectrometry (ToF-SIMS)
Document Type
TEXT
Author
Source
Subject
Language
German
Abstract
Marburg, Philipps-Universität Marburg, Diss., 2014