부산대학교 도서관

Feature reduction is an important issue in pattern recognition. Lower feature dimensionality could reduce the complexity and enhance the generalization ability of classifiers. In this paper we propose a new supervised dimensionality reduction method based on Locally Linear Embedding and Distance Metric Learning. First, in order to increase the interclass separability, a linear discriminant transformation learnt from distance metric learning is used to map the original data points to a new space. Then Locally Linear Embedding is adopted to reduce the dimensionality of data points. This process extends the traditional unsupervised Locally Linear Embedding to supervised scenario in a clear and natural way. In addition, it can also be seen as a general framework for developing new supervised dimensionality reduction algorithms by utilizing corresponding unsupervised methods. Extensive classification experiments performed on some real-world and artificial datasets show that the proposed method can achieve comparable to or even better results over other state-of-the-art dimensionality reduction methods.