학술논문

Untersuchung von leitfähigen Schichtsystemen mittels Rasterkraftmikroskopie
Study of conductive shift systems using atomic force microscopy

Document Type

Text

Author

Kleine Bußmann, Benedict; Little Bußmann, Benedict

Source

Subject

81. Materials science
73. Electronic structure and electrical properties of surfaces, interfaces and thin films
Physik
73. Electronic structure and electrical properties of surfaces, interfaces, and thin films

Language

German

Abstract

Duisburg, Essen, Universität Duisburg-Essen, Diss., 2014

Online Access

Open Access (Europeana) Find it@PNU

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