학술논문
On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond
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English
Abstract
Cottbus, Brandenburgische Technische Universität Cottbus, Diss., 2014
Cottbus, Brandenburg Technical University Cottbus, Diss., 2014
Cottbus, Brandenburg Technical University Cottbus, Diss., 2014