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Simulation of drop/impact reliability for electronic devices

Document Type

Article

Author

Wang, Y.Y. ; Lu, C.; Li, J.; Tan, X.M.; Tse, Y.C.

Source

In Finite Elements in Analysis & Design 2005 41(6):667-680

Subject

Language

ISSN

0168-874X

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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