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UHV aluminium oxide on silicon substrates: electron spectroscopies analysis and electrical measurements

Document Type

Article

Author

Gruzza, B ; Merle, S; Bideux, L; Robert, C; Kover, L; Toth, J; Matolin, V

Source

In Applied Surface Science 15 May 2001 175-176:656-662

Subject

Language

ISSN

0169-4332

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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