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Characterization of subnanometric layers by grazing incidence X-ray reflectometry

Document Type

Article

Author

Emprin, B.; Troussel, Ph.; Soullié, G.; Stemmler, Ph.; Mercère, P.; Meltchakov, E.; Jérôme, A.; Delmotte, F.

Source

In Thin Solid Films 1 April 2014 556:54-60

Subject

Language

ISSN

0040-6090

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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