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An assessment of the resolution limitation due to radiation-damage in X-ray diffraction microscopy

Document Type

Article

Author

Howells, M.R.; Beetz, T.; Chapman, H.N.; Cui, C.; Holton, J.M.; Jacobsen, C.J.; Kirz, J.; Lima, E.; Marchesini, S.; Miao, H.; Sayre, D.; Shapiro, D.A.; Spence, J.C.H.; Starodub, D.

Source

In Journal of Electron Spectroscopy and Related Phenomena 2009 170(1):4-12

Subject

Language

ISSN

0368-2048

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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