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Synchrotron analysis of structure transformations in V and V/Ag thin films

Document Type

Article

Author

Orlov, A.K.; Kruhlov, I.O.; Shamis, O.V.; Vladymyrskyi, I.A.; Kotenko, I.E.; Voloshko, S.M.; Sidorenko, S.I.; Ebisu, T.; Kato, K.; Tajiri, H.; Sakata, O.; Ishikawa, T.

Source

In Vacuum April 2018 150:186-195

Subject

Language

ISSN

0042-207X

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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