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Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides

Document Type

Article

Author

Celano, U.; Lee, Y.; Serron, J.; Smith, C.; Franco, J.; Ryu, K.; Kim, M.; Park, S.; Lee, J.; Kim, J.; van der Heide, P.

Source

In Solid State Electronics November 2021 185

Subject

Language

ISSN

0038-1101

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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