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Radiation damage of Ge-on-Si devices

Document Type

Article

Author

Ohyama, H.; Sakamoto, K.; Sukizaki, H.; Takakura, K.; Hayama, K.; Motoki, M.; Matsuo, K.; Nakamura, H.; Sawada, M.; Midorikawa, M.; Kuboyama, S.; De Jaeger, B.; Simoen, E.; Claeys, C.

Source

In Materials Science in Semiconductor Processing 2008 11(5):217-220

Subject

Language

ISSN

1369-8001

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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