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Device performance of p-Ge MOSFETs at liquid nitrogen temperature

Document Type

Article

Author

Ohyama, H.; Sukizaki, H.; Takakura, K.; Motoki, M.; Matsuo, K.; Nakamura, H.; Sawada, M.; Midorikawa; Kuboyama, S.; De Jaeger, B.; Simoen, E.; Claeys, C.

Source

In Thin Solid Films 2010 518(9):2513-2516

Subject

Language

ISSN

0040-6090

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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