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In situ monitoring of stress change in GeTe thin films during thermal annealing and crystallization

Document Type

Article

Author

Ben Yahia, B.; Amara, M.S.; Gallard, M.; Burle, N.; Escoubas, S.; Guichet, C.; Putero, M.; Mocuta, C.; Richard, M.-I.; Chahine, R.; Sabbione, C.; Bernard, M.; Fellouh, L.; Noé, P.; Thomas, O.

Source

In Micro and Nano Engineering November 2018 1:63-67

Subject

Language

ISSN

2590-0072

Online Access

Full Text (ScienceDirect 종량제) Full Text (ScienceDirect O/A) Web of Science JCR 저널정보 Scopus Find it@PNU

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