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Radio-frequency reflectometry—A fast and sensitive measurement method for two-dimensional systems

Document Type

Article

Author

Taskinen, L.J.; Starrett, R.P.; Martin, T.P.; Chen, J.C.H.; Micolich, A.P.; Hamilton, A.R.; Simmons, M.Y.; Ritchie, D.A.; Pepper, M.

Source

In Physica E: Low-dimensional Systems and Nanostructures 2010 42(4):1192-1195

Subject

Language

ISSN

1386-9477

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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