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Hot-carrier evaluation of a zero-cost transistor developed via process optimization in an embedded non-volatile memory CMOS technology

Document Type

Article

Author

Devoge, P.; Aziza, H.; Lorenzini, P.; Julien, F.; Marzaki, A.; Malherbe, A.; Mantelli, M.; Cabout, T.; Delalleau, J.; Haendler, S.; Regnier, A.; Niel, S.

Source

In Microelectronics Reliability November 2021 126

Subject

Language

ISSN

0026-2714

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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