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Influence of crystal perfection on the reverse leakage current of the SiGe/Si p–n heterojunction diodes

Document Type

Article

Author

Liu, X.F ; Liu, J.P; Li, J.P; Wang, Y.T; Li, L.Y; Sun, D.Z; Kong, M.Y; Lin, L.Y

Source

In Journal of Crystal Growth 1999 201:551-555

Subject

Language

ISSN

0022-0248

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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