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Strategy against electromigration-induced stress by passivation thickness design

Document Type

Article

Author

Kimura, Yasuhiro

Source

In Thin Solid Films 1 November 2023 784

Subject

Language

ISSN

0040-6090

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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