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Effect of the switching layer on CBRAM reliability and benchmarking against OxRAM devices

Document Type

Article

Author

Belmonte, A.; Reale, G.; Fantini, A.; Radhakrishnan, J.; Redolfi, A.; Devulder, W.; Nyns, L.; Kundu, S.; Delhougne, R.; Goux, L.; Kar, G.S.

Source

In Solid State Electronics October 2021 184

Subject

Language

ISSN

0038-1101

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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