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Investigating interface states and oxide traps in the MoS2/oxide/Si system

Document Type

Article

Author

Coleman, E.; Mirabelli, G.; Bolshakov, P.; Zhao, P.; Caruso, E.; Gity, F.; Monaghan, S.; Cherkaoui, K.; Balestra, V.; Wallace, R.M.; Young, C.D.; Duffy, R.; Hurley, P.K.

Source

In Solid State Electronics December 2021 186

Subject

Language

ISSN

0038-1101

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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