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High-sensitivity and high-resolution low-energy ion scattering

Document Type

Article

Author

Brongersma, Hidde H.; Grehl, Thomas; van Hal, Paul A.; Kuijpers, Niels C.W.; Mathijssen, Simon G.J.; Schofield, Emma R.; Smith, Richard A.P.; ter Veen, Hendrik R.J.

Source

In Vacuum 2010 84(8):1005-1007

Subject

Language

ISSN

0042-207X

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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