학술논문
Test circuits for fast and reliable assessment of CDM robustness of I/O stages
Document Type
Article
Author
Stadler, W.; Esmark, K.; Reynders, K.; Zubeidat, M.; Graf, M.; Wilkening, W.; Willemen, J.; Qu, N.; Mettler, S.; Etherton, M.; Nuernbergk, D.; Wolf, H.; Gieser, H.; Soppa, W.; De Heyn, V.; Natarajan, M.; Groeseneken, G.; Morena, E.; Stella, R.; Andreini, A.; Litzenberger, M.; Pogany, D.; Gornik, E.; Foss, C.; Konrad, A.; Frank, M.
Source
In Microelectronics Reliability 2005 45(2):269-277
Subject
Language
ISSN
0026-2714