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Impact of the Pump-Out-Effect on the thermal long-term behaviour of power electronic modules

Document Type

Article

Author

Söhl, S.; Eisele, R.

Source

In Microelectronics Reliability September 2019 100-101

Subject

Language

ISSN

0026-2714

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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