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Analysis of radiation-induced transient errors on 7 nm FinFET technology

Document Type

Article

Author

Azimi, S.; De Sio, C.; Sterpone, L.

Source

In Microelectronics Reliability November 2021 126

Subject

Language

ISSN

0026-2714

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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