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Adhesion–delamination phenomena at the interfaces of the dielectric layer

Document Type

Article

Author

Pan, C.T.; Wu, C.N.; Mao, S.W.; Wang, S.Y.; Ju, S.P.; Wu, J.D.; Yen, C.K.; Chen, W.F.

Source

In Results in Physics September 2020 18

Subject

Language

ISSN

2211-3797

Online Access

Full Text (ScienceDirect 종량제) Full Text (ScienceDirect O/A) Web of Science JCR 저널정보 Scopus Find it@PNU

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