학술논문
Self-compliance multilevel resistive switching characteristics in TiN/HfOx /Al/Pt RRAM devices
Document Type
Conference Paper
Author
Source
In: 2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013 , 2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013. (2013 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2013, 2013)
Subject
Language
English