학술논문
Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process
Document Type
Conference Paper
Source
In: Proceedings of the 23rd International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2016 , Proceedings of the 23rd International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2016. (Proceedings of the 23rd International Conference Mixed Design of Integrated Circuits and Systems, MIXDES 2016, 2 August 2016, :353-358)
Subject
Language
English