학술논문
Reliability-aware design method for CMOS circuits
Document Type
Conference Paper
Source
In: CEUR Workshop Proceedings , ERMAVSS 2016 - Proceedings of the Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems, co-located with IEEE/ACM Design, Automation and Test in Europe Conference, DATE 2016. (CEUR Workshop Proceedings, 2016, 1566:17-20)
Subject
Language
English
ISSN
16130073