학술논문
Spatial and frequency domain metrics for assessing fixed-pattern noise in infrared images
Document Type
Conference Paper
Author
Source
In: SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference Proceedings , 2013 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference, IMOC 2013. (SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference Proceedings, 2013)
Subject
Language
English