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Investigation of damage induced by intense femtosecond XUV pulses in silicon crystals by means of white beam synchrotron section topography
Document Type
Article
Author
Wierzchowski, W.; Balcer, T.; Wieteska, K.; Klinger, D.; Sobierajski, R.; Pelka, J.B.; Zymierska, D.; Chalupský, J.; Hájková, V.; Burian, T.; Juha, L.; Vyšín, L.; Gaudin, J.; Sinn, H.; Gleeson, A.J.; Sobota, D.; Tiedtke, K.; Toleikis, S.; Tschentscher, T.; Wabnitz, H.; Paulmann, C.
Source
In: Radiation Physics and Chemistry. (Radiation Physics and Chemistry, December 2013, 93:99-103)
Subject
Language
English
ISSN
0969806X
18790895

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