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The Schottky-Mott Rule Expanded for Two-Dimensional Semiconductors: Influence of Substrate Dielectric Screening

Document Type

Article

Author

Park, S.; Schultz, T.; Shin, D.; Mutz, N.; List-Kratochvil, E.J.W.; Blumstengel, S.; Amsalem, P.; Koch, N.; Aljarb, A.; Tung, V.; Kang, H.S.; Lee, C.-H.; Li, L.-J.; Xu, X.

Source

In: ACS Nano. (ACS Nano, 28 September 2021, 15(9):14794-14803)

Subject

Language

English

ISSN

1936086X
19360851

Online Access

Full Text (ACS) Web of Science JCR 저널정보 Scopus Find it@PNU

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