학술논문
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults
Document Type
Conference Paper
Source
In: Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023 , Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023. (Proceedings - 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2023, 2023, :21-26)
Subject
Language
English